Process / pipelineScanning probe microscopy
原子力显微镜
原子力显微镜（AFM）是一种扫描探针技术，通过监测尖锐的悬臂梁探针尖端与样品表面之间的相互作用，来测量纳米尺度的表面形貌和力学性质。AFM 由 Gerd Binnig 于 1986 年发明，是扫描隧道显微镜的延伸，它既不需要导电性也不需要真空操作，因此几乎适用于任何材料。它能提供具有亚纳米垂直分辨率和接近纳米横向分辨率的三维形貌图，同时还能同步测量力学、电学和化学性质。
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来源
- Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. DOI: 10.1103/PhysRevLett.56.930 ↗
- Eaton, P., & West, P. (2005). Atomic Force Microscopy. Oxford University Press. link ↗
- Butt, H. J., Cappella, B., & Kappl, M. (2005). Force measurements with the atomic force microscope: Technique, interpretation and applications. Surface Science Reports, 59(1-6), 1-152. DOI: 10.1016/j.surfrep.2005.08.003 ↗
如何引用本页
ScholarGate. (2026, June 3). Atomic Force Microscopy (AFM). ScholarGate. https://scholargate.app/zh/materials-science/atomic-force-microscopy
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