Process / pipelineElectron crystallography
选区电子衍射
选区电子衍射（Selected Area Electron Diffraction, SAED）是一种透射电子显微镜学的晶体学技术，可从微米或亚微米尺寸的晶体区域获得电子衍射图样。SAED基于电子波动行为的基本原理，并于20世纪中叶集成到透射电子显微镜（TEM）仪器中，它能够直接观察倒空间、晶体对称性和缺陷结构，其空间分辨率是X射线衍射无法比拟的。该技术对于研究局部晶体结构、相鉴定和表征纳米材料至关重要。
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来源
- Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer. DOI: 10.1007/978-0-387-76501-3 ↗
- Cullity, B. D., & Stock, S. R. (2014). Elements of X-ray Diffraction (3rd ed.). Pearson Education. link ↗
- Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W., & Whelan, M. J. (1977). Electron Microscopy of Thin Crystals (2nd ed.). Butterworths. link ↗
如何引用本页
ScholarGate. (2026, June 3). Selected Area Electron Diffraction (SAED). ScholarGate. https://scholargate.app/zh/materials-science/selected-area-electron-diffraction
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