Process / pipelineDigital circuit testing
自动测试向量生成
自动测试向量生成（ATPG）是用于检测数字电路中制造缺陷的测试向量的自动化创建过程。ATPG 由 Roth 于 1966 年开创，它系统地寻找能够使“卡滞”故障（stuck-at faults）在输出端可观察到的输入，从而实现全面的故障检测。ATPG 对于半导体制造至关重要：实现高测试覆盖率可确保仅有合格的芯片出厂，并识别制造过程中的问题。
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来源
- Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. link ↗
- Roth, J. P. (1966). Diagnosis of automata failures: A calculus and a method. IBM Journal of Research and Development, 10(4), 278-291. DOI: 10.1147/rd.104.0278 ↗
- Goel, P. (1981). An implicit enumeration algorithm to generate tests for combinational circuits. IEEE Transactions on Computers, 30(3), 215-222. link ↗
如何引用本页
ScholarGate. (2026, June 3). Automatic Test Pattern Generation for Digital Circuits. ScholarGate. https://scholargate.app/zh/electrical-engineering/automatic-test-pattern-generation
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