Differential Item Functioning in Educational Testing
Differential item functioning (DIF) analysis is the central statistical tool for evaluating the fairness of test items in education. An item shows DIF when examinees of equal ability but different group membership — for example by gender, race/ethnicity, or language background — have unequal probabilities of answering it correctly. By conditioning on ability before comparing groups, DIF analysis separates genuine item bias from real group differences in proficiency, and flags items for expert review before they affect high-stakes decisions.
手法の全文を読む
無料アカウントでログインすると、このセクションを読めます。
手法マップ
関連する手法の近傍 — ノードを選択して探索できます。
出典
- Holland, P. W., & Wainer, H. (Eds.). (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 9780805809725
- Dorans, N. J., & Holland, P. W. (1993). DIF detection and description: Mantel-Haenszel and standardization. In P. W. Holland & H. Wainer (Eds.), Differential Item Functioning (pp. 35–66). Lawrence Erlbaum Associates. ISBN: 9780805809725
このページの引用方法
ScholarGate. (2026, June 22). Differential Item Functioning Analysis for Test Fairness in Education. ScholarGate. https://scholargate.app/ja/education/differential-item-functioning-education
どの手法を選ぶ?
この手法を最も近い類縁の手法と並べ、両者を見比べてください — ライブラリは本を机の上に並べるだけ。選ぶのはあなたです。
- Differential Distractor FunctioningEducation↔ 比較
- 項目応答理論における項目特性曲線(ICC)の差心理測定学↔ 比較
- 項目応答理論 (IRT)心理測定学↔ 比較
- Standardized Test AnalysisEducation↔ 比較