Latent structureItem Bias Detection
SIBTEST
SIBTEST（Simultaneous Item Bias Test，同时项目偏误检验）是一种由 Shealy 和 Stout (1993) 开发的非参数方法，用于检测微分项目功能 (DIF) 和微分测验功能 (DTF)。与参数方法不同，SIBTEST 不假设特定的项目反应模型，而是直接检验在整体能力水平相同的情况下，不同群体在正确回答每个项目上的概率是否存在差异。
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来源
- Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI: 10.1007/BF02294572 ↗
- Chang, H. H., Mazzeo, J., & Roussos, L. (1996). Detecting DIF for polytomously scored items: An adaptation of the SIBTEST procedure. Journal of Educational Measurement, 33(3), 333-353. DOI: 10.1111/j.1745-3984.1996.tb00496.x ↗
- Stout, W. F. (1987). A nonparametric approach for assessing latent trait unidimensionality. Psychometrika, 52(4), 589-617. DOI: 10.1007/BF02294821 ↗
如何引用本页
ScholarGate. (2026, June 3). SIBTEST: Simultaneous Item Bias Test. ScholarGate. https://scholargate.app/zh/psychometrics/sibtest
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