Process / pipelineAccelerated life testing
高度加速寿命试验 (HALT)
高度加速寿命试验 (HALT) 是一种用于快速识别设计缺陷并确定正常操作条件与产品失效之间裕度的方法。通过应用极端但非破坏性的应力剖面（热、振动等），HALT 加速了失效时钟，从而在数周而非数年内揭示潜在缺陷。HALT 自 20 世纪 80 年代以来得到大力发展，并由电子和机械系统领域的从业者不断完善，已成为加速产品开发和可靠性验证的关键技术。
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来源
- Leis, B. N., & Stephens, D. R. (2011). Reliability methodologies for structural integrity assessment. Journal of Pressure Vessel Technology, 133(5), 051204. link ↗
- Nelson, W. B. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. Wiley. link ↗
- Hobbs, G. K. (1997). Physical Modeling of Electronic Products for Reliability and Shelf Life. IEEE Transactions on Components, Packaging, and Manufacturing Technology, 20(2), 82-95. link ↗
- Alfirevic, D., Callerame, F., & Roberts, G. (2011). A comprehensive overview of HALT and HASS. Proceedings of the EPTC 2011. link ↗
如何引用本页
ScholarGate. (2026, June 3). Highly Accelerated Life Testing (HALT). ScholarGate. https://scholargate.app/zh/reliability-engineering/highly-accelerated-life-testing
Which method?
Set this method beside its closest kin and read them side by side — the library lays the books on the table; the choice is yours.
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