方法证据记录
SIBTEST
SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.
源记录
引文逐字复制自方法源记录。这些引文不代表任何层级的验证。
SIBTEST: Simultaneous Item Bias Test
分类方法记录 · latent-structure / psychometrics
- Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. · DOI 10.1007/BF02294572
- Chang, H. H., Mazzeo, J., & Roussos, L. (1996). Detecting DIF for polytomously scored items: An adaptation of the SIBTEST procedure. Journal of Educational Measurement, 33(3), 333-353. · DOI 10.1111/j.1745-3984.1996.tb00496.x
- Stout, W. F. (1987). A nonparametric approach for assessing latent trait unidimensionality. Psychometrika, 52(4), 589-617. · DOI 10.1007/BF02294821
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