方法证据记录
Atomic Force Microscopy
Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.
源记录
引文逐字复制自方法源记录。这些引文不代表任何层级的验证。
Atomic Force Microscopy (AFM)
分类方法记录 · process-pipeline / materials-science
- Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. · DOI 10.1103/PhysRevLett.56.930
- Eaton, P., & West, P. (2005). Atomic Force Microscopy. Oxford University Press. · URL
- Butt, H. J., Cappella, B., & Kappl, M. (2005). Force measurements with the atomic force microscope: Technique, interpretation and applications. Surface Science Reports, 59(1-6), 1-152. · DOI 10.1016/j.surfrep.2005.08.003
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