Process / pipelineX-ray Spectroscopy
EXAFS
扩展X射线吸收精细结构（EXAFS）是一种基于同步加速器的X射线光谱技术，用于测量任何材料（无论是晶体还是非晶态）中特定原子周围的局部几何和电子结构。EXAFS由Sayers、Stern和Lytle于1971年发现，通过分析吸收边上方X射线吸收光谱中的振荡，揭示原子间距离、配位数和原子环境中的无序性。
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来源
- Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI: 10.1103/PhysRevLett.27.1204 ↗
- Stern, E. A., Sayers, D. E., & Lytle, F. W. (1975). Extended x-ray-absorption-fine-structure technique. Physical Review B, 11(12), 4836-4846. DOI: 10.1103/PhysRevB.11.4836 ↗
如何引用本页
ScholarGate. (2026, June 3). Extended X-ray Absorption Fine Structure. ScholarGate. https://scholargate.app/zh/spectroscopy/exafs
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