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| 蒙特卡洛工艺变化分析× | 自动测试向量生成× | |
|---|---|---|
| 领域 | 电气工程 | 电气工程 |
| 方法族 | Process / pipeline | Process / pipeline |
| 起源年份≠ | 2003 | 1966 |
| 提出者≠ | George S. Fishman, Sani R. Nassif | J. Paul Roth |
| 类型≠ | Probabilistic modeling of semiconductor manufacturing variability | Automated fault-detection test vector generation |
| 开创性文献≠ | Fishman, G. S. (1996). Monte Carlo: Concepts, Algorithms, and Applications. Springer-Verlag. DOI ↗ | Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. link ↗ |
| 别名 | Monte Carlo simulation, Process variation analysis, PVT analysis | ATPG, Test pattern generation, Fault-based testing |
| 相关 | 3 | 3 |
| 摘要≠ | Monte Carlo Process Variation analysis quantifies the impact of manufacturing uncertainties on circuit performance using statistical sampling. As semiconductor technology scales, process variations (gate length, oxide thickness, dopant fluctuations) create significant uncertainties in delay, power, and leakage. Monte Carlo methods sample the random variation space, enabling statistical characterization of yield, timing margins, and reliability. Essential for modern technology nodes. | Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues. |
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