方法对比
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| 逻辑综合× | 自动测试向量生成× | |
|---|---|---|
| 领域 | 电气工程 | 电气工程 |
| 方法族 | Process / pipeline | Process / pipeline |
| 起源年份≠ | 1987 | 1966 |
| 提出者≠ | Robert Brayton | J. Paul Roth |
| 类型≠ | Automated conversion of HDL descriptions to gate-level netlists | Automated fault-detection test vector generation |
| 开创性文献≠ | Brayton, R. K., Hachtel, G. D., McMullin, C. T., Sangiovanni-Vincentelli, A. L., & Vincentelli, A. S. (1987). Logic Synthesis for VLSI Design. Kluwer Academic. link ↗ | Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. link ↗ |
| 别名 | RTL synthesis, Hardware synthesis, Logic optimization | ATPG, Test pattern generation, Fault-based testing |
| 相关 | 3 | 3 |
| 摘要≠ | Logic Synthesis is the automated conversion of high-level hardware descriptions (RTL in Verilog/VHDL) into optimized gate-level netlists. Pioneered by Brayton et al. at UC Berkeley in the 1980s-1990s, logic synthesis transforms behavioral specifications into physical implementations, optimizing for area, speed, and power. Synthesis is essential to modern digital design, enabling rapid iteration and automation of the most tedious manual tasks. | Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues. |
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