方法对比
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| 动态光散射× | XRD Rietveld精修× | |
|---|---|---|
| 领域 | 材料科学 | 材料科学 |
| 方法族 | Process / pipeline | Process / pipeline |
| 起源年份≠ | 1964 | 1969 |
| 提出者≠ | Robert Pecora | Hugo Rietveld |
| 类型≠ | Measurement method | Refinement method |
| 开创性文献≠ | Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070. link ↗ | Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71. DOI ↗ |
| 别名≠ | DLS, photon correlation spectroscopy, particle size measurement | Rietveld refinement, powder diffraction refinement |
| 相关 | 3 | 3 |
| 摘要≠ | Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions. | XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification. |
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