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Automatic Test Pattern Generation

Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.

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Automatic Test Pattern Generation for Digital Circuits

Taksonomisk metoderegister · process-pipeline / electrical-engineering

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