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Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconducto
Code coverage analysis measures the extent to which source code is executed by a test suite, quantifying which lines, branches, or paths are exercised. Tools instrument code to track execution, reporting coverage percentages and identifying untested regions. Coverage analysis guides test creation, detects dead code, an
Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploit
Yield Line Theory is a plastic limit-analysis method used in structural civil engineering to determine the ultimate load-carrying capacity of reinforced concrete slabs. Developed by K. W. Johansen in the 1940s, it assumes that at failure the slab subdivides into rigid regions separated by lines of intense plastic rotat