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Z-scan×빔 전파 방법×
분야광학광학
계열Process / pipelineProcess / pipeline
기원 연도19901978
창시자Mansoor Sheik-Bahae, David Hagan, and Eric Van StrylandMichael Feit and John Fleck
유형Measurement techniqueParaxial propagation algorithm
원전Sheik-Bahae, M., Said, A. A., Wei, T. H., Hagan, D. J., & Van Stryland, E. W. (1990). Sensitive measurement of optical nonlinearities using a single beam. IEEE Journal of Quantum Electronics, 26(4), 760-769. DOI ↗Feit, M. D., & Fleck, J. A. (1978). Light propagation in graded-index optical fibers. Applied Optics, 17(24), 3990-3998. DOI ↗
별칭Z-scan method, nonlinear refraction measurementBPM, paraxial approximation method
관련33
요약The Z-scan technique is an experimental method for measuring nonlinear optical properties of materials, particularly third-order susceptibility and nonlinear absorption. Developed by Sheik-Bahae, Hagan, and Van Stryland in 1990, Z-scan uses a tightly focused laser beam and moves the sample along the beam propagation axis (z-axis), recording transmission variation to deduce nonlinear refraction and absorption coefficients with high sensitivity.The Beam Propagation Method is a computational technique for simulating the propagation of optical beams through slowly varying, weakly guiding structures. Developed by Feit and Fleck in 1978, BPM exploits the paraxial approximation to reduce the full vector wave equation to a scalar or vector envelope equation, enabling efficient simulation of waveguides, integrated optics, and photonic devices.
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