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| 약식 정신 검사 점수× | 전두엽 기능 평가 배터리× | |
|---|---|---|
| 분야 | 신경심리학 | 신경심리학 |
| 계열 | Process / pipeline | Process / pipeline |
| 기원 연도≠ | 1972 | 2000 |
| 창시자≠ | H. Mark Hodkinson | Bruno Dubois |
| 유형≠ | Brief clinician-administered cognitive screening instrument | Clinician-administered neuropsychological battery for frontal lobe function |
| 원전≠ | Hodkinson, H. M. (1972). Evaluation of a mental test score for assessment of mental impairment in the elderly. Age and Ageing, 1(4), 233-238. DOI ↗ | Dubois, B., Slachevsky, A., Litvan, I., & Pillon, B. (2000). The FAB: A Frontal Assessment Battery at bedside. Neurology, 55(11), 1621-1626. DOI ↗ |
| 별칭≠ | AMT, AMT4, Abbreviated Mental Test Score | FAB, Frontal Battery |
| 관련 | 5 | 5 |
| 요약≠ | The Abbreviated Mental Test (AMT) is a brief, 10-item cognitive screening instrument developed by Hodkinson in 1972 and originally published in Age and Ageing. It was specifically designed to quickly assess cognitive function in older hospitalized patients, detecting delirium and dementia in acute hospital settings. The AMT is valued for its simplicity, brevity (2–3 minutes), and utility in fast-paced clinical environments where quick cognitive triage is essential. | The Frontal Assessment Battery (FAB) is a brief, clinician-administered neuropsychological battery designed to assess frontal lobe function and executive abilities at the bedside. Developed by Dubois and colleagues at the Salpêtrière Hospital in Paris in 2000, the FAB consists of six subtests measuring conceptualization, mental flexibility, motor planning, inhibitory control, and verbal fluency. The FAB is particularly sensitive to frontotemporal dementia, Parkinson's disease with cognitive decline, and other conditions affecting prefrontal function. |
| ScholarGate데이터셋 ↗ |
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