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SIBTEST×認知診断型コンピュータ適応型テスト×
分野心理測定学心理測定学
系統Latent structureLatent structure
提唱年19932007
提唱者Richard Shealy, William F. StoutXueli Xu, Jean-Paul Fox
種類Differential item functioning (DIF) assessmentSkill-adaptive testing with psychometric diagnostic classification
原典Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Choi, K. M., Lee, Y. S., & Park, Y. S. (2015). What CDM can tell about examinees' strengths and weaknesses: Cognitive diagnostic information in TIMSS. Journal of Educational Evaluation for Policy Analysis, 24(1), 79-100. link ↗
別名CD-CAT
関連55
概要SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.Cognitive Diagnostic Computerized Adaptive Testing (CD-CAT) combines computerized adaptive testing (CAT) with cognitive diagnostic models (CDMs) to efficiently assess students' specific skill profiles. Rather than producing a single overall ability score, CD-CAT adaptively selects items to quickly identify which skills a student has mastered and which need development.
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ScholarGate手法を比較: SIBTEST · Cognitive Diagnostic Computerized Adaptive Testing. 2026-06-18に以下より取得 https://scholargate.app/ja/compare