手法を比較

	項目応答理論 (IRT)	ラッシュモデル
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1952–1968	1960
提唱者	Frederic M. Lord (and Allan Birnbaum for the 2PL/3PL models)	Georg Rasch
種類	Probabilistic measurement model	Item Response Theory / Latent trait model
原典	Lord, F. M. & Novick, M. R. (1968). Statistical Theories of Mental Test Scores. Addison-Wesley.	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
別名	IRT, latent trait theory, item characteristic curve theory, modern test theory	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
関連	5	6
概要	Item response theory models the probability that a respondent answers an item correctly (or endorses it) as a function of the respondent's latent trait level and the item's own statistical properties — difficulty, discrimination, and guessing. Unlike classical test theory, IRT places persons and items on the same scale, yielding measurement that is sample-independent for items and test-independent for persons.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.