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DINAモデル×認知診断型コンピュータ適応型テスト×
分野心理測定学心理測定学
系統Latent structureLatent structure
提唱年20012007
提唱者Brian Junker, Klaas SijtsmaXueli Xu, Jean-Paul Fox
種類Discrete latent class modelSkill-adaptive testing with psychometric diagnostic classification
原典Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272. DOI ↗Choi, K. M., Lee, Y. S., & Park, Y. S. (2015). What CDM can tell about examinees' strengths and weaknesses: Cognitive diagnostic information in TIMSS. Journal of Educational Evaluation for Policy Analysis, 24(1), 79-100. link ↗
別名DINACD-CAT
関連45
概要The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips.Cognitive Diagnostic Computerized Adaptive Testing (CD-CAT) combines computerized adaptive testing (CAT) with cognitive diagnostic models (CDMs) to efficiently assess students' specific skill profiles. Rather than producing a single overall ability score, CD-CAT adaptively selects items to quickly identify which skills a student has mastered and which need development.
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ScholarGate手法を比較: DINA Model · Cognitive Diagnostic Computerized Adaptive Testing. 2026-06-18に以下より取得 https://scholargate.app/ja/compare