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| ベイズ管理図× | ベイズ統計的プロセス管理× | |
|---|---|---|
| 分野 | 実験計画法 | 実験計画法 |
| 系統 | Process / pipeline | Process / pipeline |
| 提唱年≠ | Formally developed in the 1990s–2000s; roots in Shewhart (1924) | 1950s (foundations); formalized 1990s–2000s |
| 提唱者≠ | Ulrich Menzefricke and others building on Shewhart (1924) and Bayesian inference (Bayes, 1763) | Various (Girshick & Rubin 1952 early signal detection; Menzefricke 2002 Bayesian control chart framework) |
| 種類≠ | Statistical process monitoring / quality control | Bayesian process monitoring technique |
| 原典≠ | Menzefricke, U. (2002). On the evaluation of control chart limits based on predictive distributions. Communications in Statistics — Theory and Methods, 31(8), 1423–1440. DOI ↗ | Menzefricke, U. (2002). On the evaluation of control chart factors for monitoring the process mean and variance. Journal of Quality Technology, 34(2), 167–178. link ↗ |
| 別名 | Bayesian SPC chart, Bayesian monitoring chart, posterior control chart, Bayesian Shewhart chart | Bayesian SPC, Bayesian process monitoring, B-SPC, Bayesian control charting |
| 関連≠ | 6 | 5 |
| 概要≠ | A Bayesian control chart integrates prior knowledge about a process — such as historical mean and variance — with incoming measurement data to produce dynamically updated control limits. Unlike classical Shewhart charts that fix limits from a Phase-I baseline, Bayesian charts update the posterior distribution of process parameters after each sample, yielding limits that adapt to accumulated evidence and are better calibrated under small sample sizes or non-stationary processes. | Bayesian Statistical Process Control (Bayesian SPC) extends classical SPC by replacing fixed, frequentist control limits with a probabilistic framework that incorporates prior knowledge about the process. Rather than waiting for a run of points to exceed a pre-set 3-sigma boundary, Bayesian SPC continuously updates the probability that the process has shifted given the incoming data, enabling earlier and more informed detection of out-of-control states while formally accounting for uncertainty in process parameters. |
| ScholarGateデータセット ↗ |
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