手法を比較

	自動テストパターン生成	モンテカルロ・プロセス変動解析
分野	電気工学	電気工学
系統	Process / pipeline	Process / pipeline
提唱年	1966	2003
提唱者	J. Paul Roth	George S. Fishman, Sani R. Nassif
種類	Automated fault-detection test vector generation	Probabilistic modeling of semiconductor manufacturing variability
原典	Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press.	Fishman, G. S. (1996). Monte Carlo: Concepts, Algorithms, and Applications. Springer-Verlag.
別名	ATPG, Test pattern generation, Fault-based testing	Monte Carlo simulation, Process variation analysis, PVT analysis
関連	3	3
概要	Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.	Monte Carlo Process Variation analysis quantifies the impact of manufacturing uncertainties on circuit performance using statistical sampling. As semiconductor technology scales, process variations (gate length, oxide thickness, dopant fluctuations) create significant uncertainties in delay, power, and leakage. Monte Carlo methods sample the random variation space, enabling statistical characterization of yield, timing margins, and reliability. Essential for modern technology nodes.