Process / pipelineAtomic Spectroscopy
Inductively Coupled Plasma Spectrometry
Inductively coupled plasma spectrometry is a powerful multi-element analytical technique that ionizes a sample in a high-temperature plasma and measures the emitted light (ICP-OES) or ion masses (ICP-MS) to determine elemental concentrations. Developed in the 1960s by Stanley Greenfield, ICP techniques have become the standard for trace element analysis across environmental, geological, biological, and industrial fields. The method combines exceptional sensitivity, wide dynamic range, and the ability to analyze dozens of elements simultaneously.
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Sources
- Greenfield, S., Jones, I. L., & Berry, C. T. (1968). High-pressure plasma jet source for use in atomic spectroscopy. Analyst, 93(1108), 694–697. DOI: 10.1039/an9689300694 ↗
- Montaser, A. (Ed.). (2008). Inductively Coupled Plasma Mass Spectrometry (2nd ed.). Wiley-VCH. ISBN: 978-3527606955
- Houk, R. S. (1986). Mass spectrometry of inductively coupled plasma. Analytical Chemistry, 58(1), 97A–105A. DOI: 10.1021/ac00282a003 ↗