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Hypothesis testPanel unit-root tests (2nd gen)

PANIC Test: Panel Unit Root Analysis with Common Factor Decomposition

PANIC (Panel Analysis of Non-stationarity in Idiosyncratic and Common Components) er en panel-enhedsrudetest af anden generation introduceret af Bai og Ng (2004). Den nedbryder hver panelserie i fælles faktorer og idiosynkratiske komponenter, tester derefter for enhedsrødder i hver del separat, hvilket gør den robust over for tværsnitsafhængighed – en kritisk begrænsning af tests af første generation som IPS eller LLC.

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PANIC Test: Panel Unit Root Analysis with Common Factor Decomposition
Krydssektionsmæssigt Aug…CIPS TestDynamisk Faktormodel

Kilder

  1. Bai, J., & Ng, S. (2004). A PANIC attack on unit roots and cointegration. Econometrica, 72(4), 1127–1177. DOI: 10.1111/j.1468-0262.2004.00528.x

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ScholarGate. (2026, June 2). PANIC: Panel Analysis of Non-stationarity in Idiosyncratic and Common Components. ScholarGate. https://scholargate.app/da/econometrics/panic-test

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ScholarGatePANIC (PANIC: Panel Analysis of Non-stationarity in Idiosyncratic and Common Components). Hentet 2026-06-15 fra https://scholargate.app/da/econometrics/panic-test · Datasæt: https://doi.org/10.5281/zenodo.20539026