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PANIC Test: Panel Unit Root Analysis with Common Factor Decomposition×Krydssektionsmæssigt Augmenteret Dickey-Fuller (CADF) Test×
FagområdeØkonometriØkonometri
FamilieHypothesis testHypothesis test
Oprindelsesår20042007
OphavspersonJushan Bai & Serena NgM. Hashem Pesaran
TypePanel unit root testPanel unit-root test with cross-sectional augmentation
Oprindelig kildeBai, J., & Ng, S. (2004). A PANIC attack on unit roots and cointegration. Econometrica, 72(4), 1127–1177. DOI ↗Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312. DOI ↗
AliasserPanel Analysis of Non-stationarity in Idiosyncratic and Common Components, Bai-Ng PANIC Test, Second-Generation Panel Unit Root Test, Panel Birim Kök Testi (PANIC)Cross-Sectionally Augmented ADF, Panel CADF Test, Pesaran Panel Unit Root Test, CADF Birim Kök Testi
Relaterede33
ResuméPANIC (Panel Analysis of Non-stationarity in Idiosyncratic and Common Components) is a second-generation panel unit root test introduced by Bai and Ng (2004). It decomposes each panel series into common factors and idiosyncratic components, then tests for unit roots in each part separately, making it robust to cross-sectional dependence — a critical limitation of first-generation tests such as IPS or LLC.The Cross-sectionally Augmented Dickey-Fuller (CADF) test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed to handle cross-sectional dependence among panel units. Unlike first-generation panel unit-root tests that assume cross-sectional independence, the CADF test augments individual ADF regressions with cross-sectional averages of lagged levels and first differences, making it suitable for macro-panels and cross-country studies where common factors drive co-movement.
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ScholarGateSammenlign metoder: PANIC · CADF Test. Hentet 2026-06-15 fra https://scholargate.app/da/compare