Regression modelReliability & risk
退化模型
退化模型通过跟踪裂纹长度、光输出或绝缘电阻等可测量的性能特征随时间的变化来估计产品寿命，而不是等待完全失效。这些模型由 Meeker、Escobar 和 Lu (1998) 以严谨的形式提出，将随机退化路径拟合到重复测量数据上，并将失效定义为特征首次越过预定阈值的时间，从而能够从加速试验数据中可靠地推断寿命，即使观察到的失效很少或没有失效。
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来源
- Meeker, W. Q., Escobar, L. A., & Lu, C. J. (1998). Accelerated degradation tests: modeling and analysis. Technometrics, 40(2), 89–99. DOI: 10.1080/00401706.1998.10485191 ↗
如何引用本页
ScholarGate. (2026, June 2). Degradation Models (Accelerated Degradation). ScholarGate. https://scholargate.app/zh/reliability/degradation-models
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