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| Technostress Scale× | 技术接受模型问卷× | |
|---|---|---|
| 领域 | 信息系统 | 信息系统 |
| 方法族 | Process / pipeline | Process / pipeline |
| 起源年份≠ | 2007 | 1989 |
| 提出者≠ | Tarafdar, Tu, Ragu-Nathan | Fred Davis |
| 类型≠ | Likert-scale stress measure | Likert-scale questionnaire |
| 开创性文献≠ | Tarafdar, M., Tu, Q., Ragu-Nathan, B. S., & Ragu-Nathan, T. S. (2007). The impact of technostress on role stress and productivity. Journal of Management Information Systems, 24(1), 301-328. DOI ↗ | Davis, F. D. (1989). Perceived usefulness, perceived ease of use, and user acceptance of information technology. MIS Quarterly, 13(3), 319-340. DOI ↗ |
| 别名 | Techno-stress, Technology-induced stress | TAM, Davis TAM |
| 相关 | 4 | 4 |
| 摘要≠ | The Technostress Scale, developed by Tarafdar, Tu, Ragu-Nathan, and colleagues (2007), measures the stress and negative emotions experienced by employees due to information technology use in the workplace. The scale captures five dimensions of technostress: techno-overload (excessive workload from technology demands), techno-invasion (inability to disconnect from work), techno-complexity (difficulty mastering new technology), techno-insecurity (fear of job loss due to automation), and techno-uncertainty (constant changes in technology). Technostress is linked to decreased productivity, increased burnout, and job dissatisfaction. | The Technology Acceptance Model (TAM) is a foundational framework introduced by Fred Davis in 1989 to explain user adoption of information technology. Published in MIS Quarterly, TAM posits that perceived usefulness and perceived ease of use are the primary determinants of technology acceptance, regardless of an individual's prior computer experience or technical background. |
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