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简版项目功能差异 (Short-Form DIF)×差异项目功能 (DIF)×
领域心理测量学心理测量学
方法族Latent structureLatent structure
起源年份1970s–1990s (DIF); short-form context developed in parallel with scale abbreviation literature1970s–1993
提出者Angoff, W. H. and subsequent DIF methodologistsWilliam H. Angoff and colleagues (ETS); systematized by Holland & Wainer
类型Item bias / measurement fairness analysisItem-level bias detection
开创性文献Millsap, R. E. (2012). Statistical Approaches to Measurement Invariance. Routledge. ISBN: 978-0-8058-4507-0Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
别名Short-form DIF, abbreviated scale DIF, DIF in short forms, short-scale DIF detectionDIF, item bias analysis, measurement non-equivalence, item-level measurement bias
相关65
摘要Short-form differential item functioning (DIF) analysis examines whether individual items in an abbreviated scale function equivalently across demographic or subgroup comparisons. When a scale is shortened, retained items must still behave fairly for all relevant groups — DIF analysis verifies this, ensuring that score differences reflect true ability or trait differences rather than item bias.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGate方法对比: Short form differential item functioning · Differential Item Functioning. 于 2026-06-17 检索自 https://scholargate.app/zh/compare