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| 相场模型× | XRD Rietveld精修× | |
|---|---|---|
| 领域 | 材料科学 | 材料科学 |
| 方法族 | Process / pipeline | Process / pipeline |
| 起源年份≠ | 1958 | 1969 |
| 提出者≠ | John W. Cahn | Hugo Rietveld |
| 类型≠ | Simulation method | Refinement method |
| 开创性文献≠ | Cahn, J. W. (1958). Free energy of a nonuniform system: Interfacial free energy. The Journal of Chemical Physics, 28(2), 258-267. DOI ↗ | Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71. DOI ↗ |
| 别名 | phase-field method, diffuse interface method | Rietveld refinement, powder diffraction refinement |
| 相关 | 3 | 3 |
| 摘要≠ | Phase-Field Modeling (PFM) is a continuum computational method for simulating microstructure evolution, phase transitions, and interfacial dynamics without explicitly tracking moving boundaries. Developed from Cahn-Ginzburg-Landau theory in the 1950s, PFM represents distinct phases through continuous order parameters that vary smoothly over diffuse interfaces. This approach elegantly handles topological changes (nucleation, coalescence, pinch-off), complex interface geometries, and strongly coupled multiphysics. It is the dominant method for studying dendritic growth, spinodal decomposition, grain evolution, and reactive transport in materials science. | XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification. |
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