So sánh phương pháp

	Phân tích nhiễu xạ điện tử vùng chọn lọc	Tinh luyện Rietveld bằng nhiễu xạ tia X (XRD)
Lĩnh vực	Khoa học vật liệu	Khoa học vật liệu
Họ	Process / pipeline	Process / pipeline
Năm ra đời	1913	1969
Người khởi xướng	Georges Friedel	Hugo Rietveld
Loại	Diffraction technique	Refinement method
Công trình gốc	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Tên gọi khác	SAED, electron diffraction pattern, TEM diffraction	Rietveld refinement, powder diffraction refinement
Liên quan	3	3
Tóm tắt	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.