Порівняння методів
Переглядайте обрані методи поруч; рядки з відмінностями підсвічено.
| SIBTEST× | Модель DINA× | |
|---|---|---|
| Галузь | Психометрія | Психометрія |
| Родина | Latent structure | Latent structure |
| Рік появи≠ | 1993 | 2001 |
| Автор методу≠ | Richard Shealy, William F. Stout | Brian Junker, Klaas Sijtsma |
| Тип≠ | Differential item functioning (DIF) assessment | Discrete latent class model |
| Основоположне джерело≠ | Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗ | Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272. DOI ↗ |
| Інші назви≠ | — | DINA |
| Пов'язані≠ | 5 | 4 |
| Підсумок≠ | SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability. | The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips. |
| ScholarGateНабір даних ↗ |
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