เปรียบเทียบวิธี

	Extended X-ray Absorption Fine Structure (EXAFS)	XANES
สาขาวิชา	สเปกโทรสโกปี	สเปกโทรสโกปี
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	1971	1975
ผู้ริเริ่ม	Edward Stern	Peter Lee
ประเภท	Synchrotron technique	Synchrotron technique
แหล่งต้นตำรับ	Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207.	Lee, P. A., & Pendry, J. B. (1975). Theory of extended x-ray absorption fine structure. Physical Review B, 11(8), 2795-2811.
ชื่อเรียกอื่น	EXAFS spectroscopy, X-ray absorption spectroscopy	XANES spectroscopy, near-edge X-ray absorption
ที่เกี่ยวข้อง	3	3
สรุป	Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge.	X-ray Absorption Near Edge Structure (XANES) is a synchrotron X-ray spectroscopy technique that measures the electronic and geometric structure around a specific atom by analyzing the X-ray absorption spectrum within about 50 eV of an absorption edge. Developed by Lee and Pendry in 1975, XANES is complementary to EXAFS and reveals valence state, local symmetry, and unoccupied orbital structure through near-threshold features and resonances.