เปรียบเทียบวิธี

	Extended X-ray Absorption Fine Structure (EXAFS)	ATR-FTIR
สาขาวิชา	สเปกโทรสโกปี	สเปกโทรสโกปี
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	1971	1961
ผู้ริเริ่ม	Edward Stern	Joop Fahrenfort
ประเภท	Synchrotron technique	Vibrational spectroscopy technique
แหล่งต้นตำรับ	Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207.	Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155.
ชื่อเรียกอื่น	EXAFS spectroscopy, X-ray absorption spectroscopy	ATR-IR, attenuated total reflectance, FTIR spectroscopy
ที่เกี่ยวข้อง	3	3
สรุป	Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge.	Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation.