เปรียบเทียบวิธี

	การกระเจิงแสงแบบพลวัต	Atomic Force Microscopy
สาขาวิชา	วัสดุศาสตร์	วัสดุศาสตร์
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	1964	1986
ผู้ริเริ่ม	Robert Pecora	Gerd Binnig
ประเภท	Measurement method	Imaging technique
แหล่งต้นตำรับ	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.
ชื่อเรียกอื่น	DLS, photon correlation spectroscopy, particle size measurement	AFM, scanning probe microscopy, nanoindentation microscopy
ที่เกี่ยวข้อง	3	3
สรุป	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.