เปรียบเทียบวิธี

	Atomic Force Microscopy	การเลี้ยวเบนอิเล็กตรอนในพื้นที่เลือก
สาขาวิชา	วัสดุศาสตร์	วัสดุศาสตร์
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	1986	1913
ผู้ริเริ่ม	Gerd Binnig	Georges Friedel
ประเภท	Imaging technique	Diffraction technique
แหล่งต้นตำรับ	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.
ชื่อเรียกอื่น	AFM, scanning probe microscopy, nanoindentation microscopy	SAED, electron diffraction pattern, TEM diffraction
ที่เกี่ยวข้อง	3	3
สรุป	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.