เปรียบเทียบวิธี

	Atomic Force Microscopy	การวิเคราะห์ไฟไนต์เอลิเมนต์
สาขาวิชา	วัสดุศาสตร์	วัสดุศาสตร์
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	1986	1943
ผู้ริเริ่ม	Gerd Binnig	Richard Courant
ประเภท	Imaging technique	Computational method
แหล่งต้นตำรับ	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Zienkiewicz, O. C., & Taylor, R. L. (1977). The Finite Element Method in Engineering Science. McGraw-Hill.
ชื่อเรียกอื่น	AFM, scanning probe microscopy, nanoindentation microscopy	FEA, finite element method
ที่เกี่ยวข้อง	3	4
สรุป	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Finite Element Analysis (FEA) is a numerical technique for obtaining approximate solutions to boundary value problems described by differential equations. Developed systematically by Richard Courant in 1943 and popularized by Clough in the 1960s, FEA divides a complex domain into smaller, simpler elements to solve engineering problems involving stress, strain, heat transfer, and fluid flow. It is the dominant computational method in materials science for predicting material behavior under various loading conditions.