EXAFS
Extended X-ray Absorption Fine Structure (EXAFS) ni mbinu ya upimaji wa spectroscopy ya X-ray inayotumia synchrotron kupima muundo wa kijiometri na kielektroniki wa karibu na atomu maalum katika nyenzo yoyote, iwe ya fuwele au amofasi. EXAFS, iliyogunduliwa na Sayers, Stern, na Lytle mwaka 1971, hufichua umbali kati ya atomu, idadi ya uratibu, na uharibifu katika mazingira ya atomiki kwa kuchanganua mabadiliko katika wigo wa upatikanaji wa X-ray juu ya kingo ya upatikanaji.
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Method map
The neighbourhood of related methods — select a node to explore.
Vyanzo
- Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI: 10.1103/PhysRevLett.27.1204 ↗
- Stern, E. A., Sayers, D. E., & Lytle, F. W. (1975). Extended x-ray-absorption-fine-structure technique. Physical Review B, 11(12), 4836-4846. DOI: 10.1103/PhysRevB.11.4836 ↗
Jinsi ya kunukuu ukurasa huu
ScholarGate. (2026, June 3). Extended X-ray Absorption Fine Structure. ScholarGate. https://scholargate.app/sw/spectroscopy/exafs
Which method?
Set this method beside its closest kin and read them side by side — the library lays the books on the table; the choice is yours.
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