ScholarGate
Msaidizi
Latent structureItem Bias Detection

SIBTEST

SIBTEST (Kipimo cha pamoja cha upendeleo wa kipengee) ni njia isiyo ya kigezo kwa ajili ya kugundua utendaji tofauti wa kipengee (DIF) na utendaji tofauti wa kipimo (DTF) iliyoandaliwa na Shealy na Stout (1993). Tofauti na mbinu za kigezo, SIBTEST haidhanii mfumo maalum wa utendaji wa kipengee na hujaribu moja kwa moja kama makundi yanatofautiana katika uwezekano wao wa kujibu kwa usahihi kwa viwango sawa vya uwezo wa jumla.

Fungua katika MethodMindHivi karibuniVideoHivi karibuniDownload slides

Soma mbinu kamili

Kwa wanachama pekee

Ingia kwa akaunti ya bure ili kusoma sehemu hii.

Ingia

Method map

The neighbourhood of related methods — select a node to explore.

Vyanzo

  1. Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI: 10.1007/BF02294572
  2. Chang, H. H., Mazzeo, J., & Roussos, L. (1996). Detecting DIF for polytomously scored items: An adaptation of the SIBTEST procedure. Journal of Educational Measurement, 33(3), 333-353. DOI: 10.1111/j.1745-3984.1996.tb00496.x
  3. Stout, W. F. (1987). A nonparametric approach for assessing latent trait unidimensionality. Psychometrika, 52(4), 589-617. DOI: 10.1007/BF02294821

Jinsi ya kunukuu ukurasa huu

ScholarGate. (2026, June 3). SIBTEST: Simultaneous Item Bias Test. ScholarGate. https://scholargate.app/sw/psychometrics/sibtest

Which method?

Set this method beside its closest kin and read them side by side — the library lays the books on the table; the choice is yours.

Compare side by side
ScholarGateSIBTEST (SIBTEST: Simultaneous Item Bias Test). Imepatikana 2026-06-15 kutoka https://scholargate.app/sw/psychometrics/sibtest · Seti ya data: https://doi.org/10.5281/zenodo.20539026