Linganisha mbinu

	Atomic Force Microscopy	Uchambuzi wa Thermogravimetric
Nyanja	Sayansi ya Vifaa	Sayansi ya Vifaa
Familia	Process / pipeline	Process / pipeline
Mwaka wa asili	1986	1960s
Mwanzilishi	Gerd Binnig	William W. Wendlandt
Aina	Imaging technique	Characterization method
Chanzo asilia	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Wendlandt, W. W. (1986). Thermal Analysis (3rd ed.). John Wiley & Sons.
Majina mbadala	AFM, scanning probe microscopy, nanoindentation microscopy	TGA, thermal gravimetry, thermogravimetry
Zinazohusiana	3	3
Muhtasari	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Thermogravimetric Analysis (TGA) is a thermal characterization technique that continuously measures mass loss or gain of a material as a function of temperature (or time at constant temperature). Developed systematically by William Wendlandt and colleagues in the 1960s, TGA identifies thermal transitions (evaporation, decomposition, oxidation, reduction) and quantifies composition of polymers, pharmaceuticals, ceramics, and other materials. The derivative signal (DTG) highlights transition temperatures. When combined with gas analysis (MS, FTIR), decomposition products are identified.