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Modelo Rasch de Forma Curta×Differential Item Functioning×
ÁreaPsicometriaPsicometria
FamíliaLatent structureLatent structure
Ano de origem1960 (Rasch model); short-form application from 1980s onward1970s–1993
Autor originalGeorg RaschWilliam H. Angoff and colleagues (ETS); systematized by Holland & Wainer
TipoProbabilistic item response modelItem-level bias detection
Fonte seminalRasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut. link ↗Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
Outros nomesRasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch modelDIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Relacionados65
ResumoThe short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGateComparar métodos: Short form Rasch model · Differential Item Functioning. Recuperado em 2026-06-17 de https://scholargate.app/pt/compare