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SIBTEST×Pengujian Adaptif Berkomputer Diagnostik Kognitif×Model DINA×
BidangPsikometrikPsikometrikPsikometrik
KeluargaLatent structureLatent structureLatent structure
Tahun asal199320072001
PengasasRichard Shealy, William F. StoutXueli Xu, Jean-Paul FoxBrian Junker, Klaas Sijtsma
JenisDifferential item functioning (DIF) assessmentSkill-adaptive testing with psychometric diagnostic classificationDiscrete latent class model
Sumber perintisShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Choi, K. M., Lee, Y. S., & Park, Y. S. (2015). What CDM can tell about examinees' strengths and weaknesses: Cognitive diagnostic information in TIMSS. Journal of Educational Evaluation for Policy Analysis, 24(1), 79-100. link ↗Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272. DOI ↗
AliasCD-CATDINA
Berkaitan554
RingkasanSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.Cognitive Diagnostic Computerized Adaptive Testing (CD-CAT) combines computerized adaptive testing (CAT) with cognitive diagnostic models (CDMs) to efficiently assess students' specific skill profiles. Rather than producing a single overall ability score, CD-CAT adaptively selects items to quickly identify which skills a student has mastered and which need development.The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips.
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ScholarGateBandingkan kaedah: SIBTEST · Cognitive Diagnostic Computerized Adaptive Testing · DINA Model. Dicapai 2026-06-19 daripada https://scholargate.app/ms/compare