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Sintesis Logik×Penjanaan Corak Ujian Automatik×
BidangKejuruteraan ElektrikKejuruteraan Elektrik
KeluargaProcess / pipelineProcess / pipeline
Tahun asal19871966
PengasasRobert BraytonJ. Paul Roth
JenisAutomated conversion of HDL descriptions to gate-level netlistsAutomated fault-detection test vector generation
Sumber perintisBrayton, R. K., Hachtel, G. D., McMullin, C. T., Sangiovanni-Vincentelli, A. L., & Vincentelli, A. S. (1987). Logic Synthesis for VLSI Design. Kluwer Academic. link ↗Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. link ↗
AliasRTL synthesis, Hardware synthesis, Logic optimizationATPG, Test pattern generation, Fault-based testing
Berkaitan33
RingkasanLogic Synthesis is the automated conversion of high-level hardware descriptions (RTL in Verilog/VHDL) into optimized gate-level netlists. Pioneered by Brayton et al. at UC Berkeley in the 1980s-1990s, logic synthesis transforms behavioral specifications into physical implementations, optimizing for area, speed, and power. Synthesis is essential to modern digital design, enabling rapid iteration and automation of the most tedious manual tasks.Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.
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ScholarGateBandingkan kaedah: Logic Synthesis · Automatic Test Pattern Generation. Dicapai 2026-06-15 daripada https://scholargate.app/ms/compare