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| 문항반응이론(IRT) 기반 컴퓨터 적응 검사 (CAT-IRT)× | Rasch 모형× | |
|---|---|---|
| 분야 | 심리측정학 | 심리측정학 |
| 계열 | Latent structure | Latent structure |
| 기원 연도≠ | 1970s–1980s | 1960 |
| 창시자≠ | Lord, F. M.; further developed by Wainer, van der Linden, and others | Georg Rasch |
| 유형≠ | Adaptive measurement / sequential testing | Item Response Theory / Latent trait model |
| 원전≠ | Wainer, H. (Ed.). (2000). Computerized Adaptive Testing: A Primer (2nd ed.). Lawrence Erlbaum Associates. ISBN: 978-0805835113 | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| 별칭 | CAT-IRT, adaptive testing, IRT-based CAT, computerized adaptive testing | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| 관련≠ | 4 | 6 |
| 요약≠ | Computerized adaptive testing based on item response theory is a sequential measurement procedure in which a computer algorithm selects successive test items tailored to each examinee's estimated ability level. Drawing on IRT to model item characteristics and ability estimation, CAT delivers precise scores with far fewer items than fixed-length tests, making it efficient for high-stakes assessments, clinical screening, and large-scale surveys. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
| ScholarGate데이터셋 ↗ |
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