手法を比較

	短縮版尺度開発	項目応答理論 (IRT)
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1990s–2000s	1952–1968
提唱者	Multiple contributors; foundational critique by Smith, McCarthy & Anderson (2000); practical guidance by Stanton et al. (2002)	Frederic M. Lord (and Allan Birnbaum for the 2PL/3PL models)
種類	Scale development methodology	Probabilistic measurement model
原典	Stanton, J. M., Sinar, E. F., Balzer, W. K., & Smith, P. C. (2002). Issues and strategies for reducing the length of self-report scales. Personnel Psychology, 55(1), 167–194.	Lord, F. M. & Novick, M. R. (1968). Statistical Theories of Mental Test Scores. Addison-Wesley.
別名	scale abbreviation, abbreviated scale development, short-scale construction, item reduction methodology	IRT, latent trait theory, item characteristic curve theory, modern test theory
関連	5	5
概要	Short-form scale development is the systematic process of reducing a full-length psychological scale to a smaller subset of items while preserving the construct validity, reliability, and measurement properties of the original instrument. It is widely used when administration burden must be minimised without sacrificing psychometric quality.	Item response theory models the probability that a respondent answers an item correctly (or endorses it) as a function of the respondent's latent trait level and the item's own statistical properties — difficulty, discrimination, and guessing. Unlike classical test theory, IRT places persons and items on the same scale, yielding measurement that is sample-independent for items and test-independent for persons.