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| 測定不変性テスト× | 項目応答理論における項目応答の不均衡分析 (DIF)× | |
|---|---|---|
| 分野 | 心理測定学 | 心理測定学 |
| 系統 | Latent structure | Latent structure |
| 提唱年≠ | 2000 | 1988 |
| 提唱者≠ | Vandenberg & Lance | Paul W. Holland & Dorothy T. Thayer (Mantel-Haenszel approach, 1988) |
| 種類≠ | Multi-group confirmatory factor analysis procedure | Item-level fairness / measurement equivalence analysis |
| 原典≠ | Vandenberg, R. J., & Lance, C. E. (2000). A review and synthesis of the measurement invariance literature. Organizational Research Methods, 3(1), 4–70. DOI ↗ | Holland, P. W. & Thayer, D. T. (1988). Differential Item Performance and the Mantel-Haenszel Procedure. ETS Research Report Series. link ↗ |
| 別名≠ | Factorial Invariance, Measurement Equivalence, Configural-Metric-Scalar Testing, Ölçüm Değişmezliği | Madde Yanlılık Analizi (DIF — Differential Item Functioning), item bias analysis, Mantel-Haenszel DIF, Lord chi-square DIF |
| 関連≠ | 3 | 4 |
| 概要≠ | Measurement invariance testing is a sequence of nested confirmatory factor analysis (CFA) models that examines whether a psychological scale measures the same latent construct in the same way across distinct groups or time points. Systematized and popularized by Vandenberg and Lance (2000), the procedure tests a hierarchy of constraints — from identical factor patterns to identical item intercepts — so that researchers can justify meaningful group comparisons on latent means. | Differential Item Functioning analysis examines whether examinees from different groups — such as gender, ethnicity, or language background — who have the same underlying ability respond differently to a test item. First formalised by Holland and Thayer in 1988 via the Mantel-Haenszel procedure, it is the principal tool in modern test development for detecting and removing item bias. |
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