手法を比較

	項目応答理論における項目特性曲線（ICC）の差	ラッシュモデル
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1970s–1993	1960
提唱者	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer	Georg Rasch
種類	Item-level bias detection	Item Response Theory / Latent trait model
原典	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
別名	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
関連	5	6
概要	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.