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	コンピュータ適応型テスト項目分析	ラッシュモデル
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1970s–1990s	1960
提唱者	Lord, Weiss, and colleagues in psychometric research on adaptive testing	Georg Rasch
種類	Item calibration and evaluation	Item Response Theory / Latent trait model
原典	van der Linden, W. J. & Glas, C. A. W. (Eds.) (2000). Computerized Adaptive Testing: Theory and Practice. Kluwer Academic Publishers. ISBN: 978-0792365556	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
別名	CAT item analysis, adaptive item calibration, IRT-based CAT item evaluation, adaptive item parameter estimation	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
関連	6	6
概要	Computerized adaptive test item analysis evaluates and calibrates items intended for use in adaptive testing environments. Unlike fixed-form analysis, it accounts for the non-random item exposure inherent in adaptive administration, using item response theory to estimate item parameters, information functions, and exposure rates across the ability continuum.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.