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| 自動テストパターン生成× | 静的タイミング解析× | |
|---|---|---|
| 分野 | 電気工学 | 電気工学 |
| 系統 | Process / pipeline | Process / pipeline |
| 提唱年≠ | 1966 | 1995 |
| 提唱者≠ | J. Paul Roth | Harish Bhatnagar |
| 種類≠ | Automated fault-detection test vector generation | Non-simulation timing verification for digital circuits |
| 原典≠ | Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. link ↗ | Bhatnagar, H., & Bhatnagar, R. (1995). Static timing analysis: A primer. In VLSI Handbook (pp. 1-25). CRC Press. link ↗ |
| 別名 | ATPG, Test pattern generation, Fault-based testing | STA, Timing verification, Path-based timing |
| 関連 | 3 | 3 |
| 概要≠ | Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues. | Static Timing Analysis (STA) is a non-simulation method for verifying that digital circuits meet timing constraints (clock frequencies, setup/hold times, propagation delays). Introduced systematically by Bhatnagar et al. in the 1990s, STA computes worst-case and best-case path delays by analyzing logic paths without simulating vectors. STA is essential for modern VLSI design, enabling fast timing closure before silicon and identifying critical paths for optimization. |
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