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原子間力顕微鏡×BET比表面積×
分野材料科学材料科学
系統Process / pipelineProcess / pipeline
提唱年19861938
提唱者Gerd BinnigBrunauer, Emmett, Teller
種類Imaging techniqueMeasurement method
原典Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. DOI ↗Brunauer, S., Emmett, P. H., & Teller, E. (1938). Adsorption of gases in multimolecular layers. Journal of the American Chemical Society, 60(2), 309-319. DOI ↗
別名AFM, scanning probe microscopy, nanoindentation microscopyBET analysis, nitrogen adsorption, surface area measurement
関連33
概要Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.Brunauer-Emmett-Teller (BET) Surface Area Analysis is a technique for measuring the specific surface area of solids by analyzing their nitrogen adsorption isotherms. Developed by Brunauer, Emmett, and Teller in 1938, BET theory extends monolayer adsorption (Langmuir) to multilayer adsorption, enabling quantification of surface area of porous and powdered materials. It is the industry standard for characterizing catalysts, adsorbents, pharmaceuticals, and porous materials, providing critical data for performance prediction and quality control.
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ScholarGate手法を比較: Atomic Force Microscopy · BET Surface Area. 2026-06-19に以下より取得 https://scholargate.app/ja/compare