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	Scattering Dinamico della Luce	Analisi Termogravimetrica	Raffinement Rietveld per XRD
Campo	Scienza dei materiali	Scienza dei materiali	Scienza dei materiali
Famiglia	Process / pipeline	Process / pipeline	Process / pipeline
Anno di origine	1964	1960s	1969
Ideatore	Robert Pecora	William W. Wendlandt	Hugo Rietveld
Tipo	Measurement method	Characterization method	Refinement method
Fonte seminale	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.	Wendlandt, W. W. (1986). Thermal Analysis (3rd ed.). John Wiley & Sons.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Alias	DLS, photon correlation spectroscopy, particle size measurement	TGA, thermal gravimetry, thermogravimetry	Rietveld refinement, powder diffraction refinement
Correlati	3	3	3
Sintesi	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.	Thermogravimetric Analysis (TGA) is a thermal characterization technique that continuously measures mass loss or gain of a material as a function of temperature (or time at constant temperature). Developed systematically by William Wendlandt and colleagues in the 1960s, TGA identifies thermal transitions (evaporation, decomposition, oxidation, reduction) and quantifies composition of polymers, pharmaceuticals, ceramics, and other materials. The derivative signal (DTG) highlights transition temperatures. When combined with gas analysis (MS, FTIR), decomposition products are identified.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.