विधियों की तुलना करें

	ब्रेउश-गॉडफ्रे एलएम टेस्ट (Breusch-Godfrey LM Test) फॉर सीरियल कोरिलेशन	CIPS परीक्षण
क्षेत्र	अर्थमिति	अर्थमिति
परिवार	Regression model	Hypothesis test
उद्भव वर्ष	1978	2007
प्रवर्तक	Trevor Breusch & Leslie Godfrey	M. Hashem Pesaran
प्रकार	Lagrange-multiplier test for serial correlation	Panel unit-root test with cross-section dependence
मौलिक स्रोत	Godfrey, L. G. (1978). Testing against general autoregressive and moving average error models when the regressors include lagged dependent variables. Econometrica, 46(6), 1293–1301.	Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312.
उपनाम	BG test, LM test for autocorrelation, Breusch-Godfrey serial correlation test, Breusch-Godfrey otokorelasyon testi	Pesaran CIPS Test, Cross-Sectionally Augmented IPS, Second-Generation Panel Unit-Root Test, CIPS Birim Kök Testi
संबंधित	3	3
सारांश	The Breusch-Godfrey test is a Lagrange-multiplier test for serial correlation in regression residuals, developed independently by Trevor Breusch (1978) and Leslie Godfrey (1978). Unlike the Durbin-Watson test, it detects autocorrelation up to any chosen order p, remains valid when the model includes lagged dependent variables, and produces a definite chi-square p-value rather than an inconclusive region — making it the modern standard for autocorrelation testing.	The CIPS test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed for panels in which the cross-sectional units share unobserved common factors that induce cross-section dependence. By augmenting each individual ADF regression with cross-sectional averages and their lags, the CIPS test accounts for this dependence and produces reliable inference where first-generation tests such as the original IPS test break down. It is widely applied in macroeconomic and finance panels where shocks propagate across countries or regions.